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Article
Influence of an Extended Stub at Connector Ports on Signal Launches and TRL De-embedding
Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2006, Portland, OR)
  • Jianmin Zhang
  • James L. Drewniak, Missouri University of Science and Technology
  • David Pommerenke, Missouri University of Science and Technology
  • Bruce Archambeault, Missouri University of Science and Technology
  • Zhiping Yang
  • Wheling Cheng
  • John Fisher
  • Sergio Camerlo
Abstract

Characterization of PCBs (Printed Circuit Boards) is usually associated with measurement using a VNA (Vector Network Analyzer) in the frequency-domain or a TDR (Time Domain Reflectometer) in the time-domain. The often used signal launch techniques on PCBs based on the VNA or TDR measurement in the microwave frequency range use SMA or 3.5 mm connectors, in edge-launch or vertical-launch fashions. The signal transition between the launch port and the DUT (Device Under Test) introduces errors in the measurement, which is dominant when compared with a transmission line itself on the PCB as the technologies of PCB manufacturing well developed today. Discontinuities at connector ports depend on the port structures and the dielectric properties of the substrate materials. However, an extended stub at a connector port may significantly influence signal launches, or even corrupt a TRL calibration in a measurement.

Meeting Name
IEEE International Symposium on Electromagnetic Compatibility (2006: Aug. 14-18, Portland, OR)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
  • Port Launch Techniques,
  • TDR Measurement,
  • TRL Deembedding,
  • VNA Measurement,
  • Electric Lines,
  • Frequency Domain Analysis,
  • Measurement Errors,
  • Printed Circuit Boards,
  • Signal Analysis,
  • Electric Connectors,
  • Connectors,
  • Calibration,
  • Frequency Measurement,
  • Transmission Line Measurements,
  • Testing,
  • Dielectric Measurements,
  • Dielectric Substrates,
  • Dielectric Loss Measurement,
  • Time Domain Analysis,
  • Transmission Line Discontinuities
International Standard Book Number (ISBN)
142440293X; 9781424402939
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2006 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
8-1-2006
Citation Information
Jianmin Zhang, James L. Drewniak, David Pommerenke, Bruce Archambeault, et al.. "Influence of an Extended Stub at Connector Ports on Signal Launches and TRL De-embedding" Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2006, Portland, OR) Vol. 1 (2006) p. 172 - 177 ISSN: 1077-4076
Available at: http://works.bepress.com/david-pommerenke/125/