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Article
Influence of an Extended Stub at Connector Ports on Signal Launches and TRL De-embedding
Proceedings of the 2006 IEEE International Symposium on Electromagnetic Compatibility (2006, Portland, OR)
  • James L. Drewniak, Missouri University of Science and Technology
  • David Pommerenke, Missouri University of Science and Technology
  • Jianmin Zhang
  • Zhiping Yang
Meeting Name
2006 IEEE International Symposium on Electromagnetic Compatibility (2006, Portland, OR)
Department(s)
Electrical and Computer Engineering
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2006 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
1-1-2006
Citation Information
James L. Drewniak, David Pommerenke, Jianmin Zhang and Zhiping Yang. "Influence of an Extended Stub at Connector Ports on Signal Launches and TRL De-embedding" Proceedings of the 2006 IEEE International Symposium on Electromagnetic Compatibility (2006, Portland, OR) (2006)
Available at: http://works.bepress.com/david-pommerenke/125/