Finding the Root Cause of an ESD Upset EventProceedings of DesignCon 2006 (2006, Santa Clara, CA)
AbstractSystem level Electrostatic Discharges (ESD) can lead to soft-errors (e.g., bit-errors, wrong resets etc.). By this talk we try to offer guidance in finding the root cause of upsets frequently observed in immunity testing (e.g., ESD, EFT). At first a description of the ESD discharge process is given. It provides the necessary background for correctly analyzing ESD failures. Local scanning and in-circuit measurement techniques are explained. Further, it is shown how PCB scanning results, revealing local sensitivities, can be used for the characterization and optimization of circuit and ICs design and software for minimizing unwanted responses to soft-error causing noise. A series of measurements of such noise voltages coupled into a sensitive trace are presented.
Meeting NameDesignCon 2006 (2006: Feb. 6-9, Santa Clara, CA)
Department(s)Electrical and Computer Engineering
Keywords and Phrases
- Electrostatic Discharges
Library of Congress Subject HeadingsElectric discharges
Document TypeArticle - Conference proceedings
Rights© 2006 International Engineering Consortium, All rights reserved.
Citation InformationDavid Pommerenke, Jayong Koo and Giorgi Muchaidze. "Finding the Root Cause of an ESD Upset Event" Proceedings of DesignCon 2006 (2006, Santa Clara, CA) (2006)
Available at: http://works.bepress.com/david-pommerenke/117/