Skip to main content
Finding the Root Cause of an ESD Upset Event
Proceedings of DesignCon 2006 (2006, Santa Clara, CA)
  • David Pommerenke, Missouri University of Science and Technology
  • Jayong Koo
  • Giorgi Muchaidze
System level Electrostatic Discharges (ESD) can lead to soft-errors (e.g., bit-errors, wrong resets etc.). By this talk we try to offer guidance in finding the root cause of upsets frequently observed in immunity testing (e.g., ESD, EFT). At first a description of the ESD discharge process is given. It provides the necessary background for correctly analyzing ESD failures. Local scanning and in-circuit measurement techniques are explained. Further, it is shown how PCB scanning results, revealing local sensitivities, can be used for the characterization and optimization of circuit and ICs design and software for minimizing unwanted responses to soft-error causing noise. A series of measurements of such noise voltages coupled into a sensitive trace are presented.
Meeting Name
DesignCon 2006 (2006: Feb. 6-9, Santa Clara, CA)
Electrical and Computer Engineering

Intel Corporation

Keywords and Phrases
  • ESD,
  • Electrostatic Discharges,
  • Electric discharges
Document Type
Article - Conference proceedings
Document Version
File Type
© 2006 International Engineering Consortium, All rights reserved.
Publication Date
Citation Information
David Pommerenke, Jayong Koo and Giorgi Muchaidze. "Finding the Root Cause of an ESD Upset Event" Proceedings of DesignCon 2006 (2006, Santa Clara, CA) (2006)
Available at: