Experimental Investigation of the ESD Sensitivity of an 8-bit MicrocontrollerProceedings of the 2007 IEEE International Symposium on Electromagnetic Compatibility
AbstractIn this paper, the susceptibility of an 8-bit microcontroller to electrostatic discharge (ESD) and electrically fast transients was tested by injecting currents through a capacitive probe into the microcontroller package pins. The reaction of the microcontroller to discharges with different rise times and polarities were investigated by measuring the voltage on the tested pins and by observing the microcontroller's clock output. Susceptibility varied significantly when injecting to one pin compared to another. Interestingly, the clock was more sensitive to currents injected into I/O pins than into pins directly related to the clock (e. g. EXTAL). Further work is underway to explain the causes of susceptibility inside the IC.
Meeting Name2007 IEEE International Symposium on Electromagnetic Compatibility
Department(s)Electrical and Computer Engineering
Keywords and Phrases
- Electrostatic Discharge,
Library of Congress Subject HeadingsElectric discharges
Document TypeArticle - Conference proceedings
Document VersionFinal Version
Rights© 2007 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Citation InformationDaryl G. Beetner, Ross Carlton, Lijun Han, Jayong Koo, et al.. "Experimental Investigation of the ESD Sensitivity of an 8-bit Microcontroller" Proceedings of the 2007 IEEE International Symposium on Electromagnetic Compatibility (2007)
Available at: http://works.bepress.com/david-pommerenke/109/