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Article
Experimental Investigation of the ESD Sensitivity of an 8-bit Microcontroller
Proceedings of the 2007 IEEE International Symposium on Electromagnetic Compatibility
  • Daryl G. Beetner, Missouri University of Science and Technology
  • Ross Carlton
  • Lijun Han
  • Jayong Koo
  • David Pommerenke, Missouri University of Science and Technology
Abstract
In this paper, the susceptibility of an 8-bit microcontroller to electrostatic discharge (ESD) and electrically fast transients was tested by injecting currents through a capacitive probe into the microcontroller package pins. The reaction of the microcontroller to discharges with different rise times and polarities were investigated by measuring the voltage on the tested pins and by observing the microcontroller's clock output. Susceptibility varied significantly when injecting to one pin compared to another. Interestingly, the clock was more sensitive to currents injected into I/O pins than into pins directly related to the clock (e. g. EXTAL). Further work is underway to explain the causes of susceptibility inside the IC.
Meeting Name
2007 IEEE International Symposium on Electromagnetic Compatibility
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
  • Electrostatic Discharge,
  • Sensitivity
Library of Congress Subject Headings
Electric discharges
Microcontrollers
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2007 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
1-1-2007
Citation Information
Daryl G. Beetner, Ross Carlton, Lijun Han, Jayong Koo, et al.. "Experimental Investigation of the ESD Sensitivity of an 8-bit Microcontroller" Proceedings of the 2007 IEEE International Symposium on Electromagnetic Compatibility (2007)
Available at: http://works.bepress.com/david-pommerenke/109/