Testing and debugging of immunity issues is challenging in part because it is not known which components inside a system are impacted by an immunity test or at what level. Attaching cables and probes to determine stress voltages and currents within a system is time consuming and can alter the test results. Sensors are proposed for measuring the peak stress voltage experienced within a system during a transient immunity test. The peak current can also be found when the sensor is placed across a transient voltage suppressor with a known I-V curve. The peak level is transmitted wirelessly to a receiver outside the system using frequency-modulated magnetic or electric fields, thus allowing multiple measurements to be made without opening the enclosure or otherwise modifying the system. Two sensing circuits are proposed: one that stores the peak voltage on an external capacitor and the other that uses an analog-to-digital converter to store the level in a register. The capabilities of the circuits were validated with a combination of SPICE and electromagnetic simulations when the sensor was placed inside a typical cell phone enclosure. Simulations demonstrate that the sensors can accurately detect the peak transient voltage and transmit the level to an external receiver.
- Analog to digital conversion,
- Electric discharges,
- Electromagnetic simulation,
- Electrostatic devices,
- Enclosures,
- Mobile phones,
- Power quality,
- Program debugging,
- Sensors,
- SPICE,
- Testing,
- Analog to digital converters,
- Electro-Static Discharge (ESD),
- Fast transients,
- Frequency modulated,
- Multiple measurements,
- Testing and debugging,
- Transient voltage,
- Transient voltage suppressors,
- Transients,
- Electrically fast transient (EFT),
- Electrostatic discharge (ESD),
- Suppressor (TVS)
Available at: http://works.bepress.com/daryl-beetner/98/
This work was supported by the National Science Foundation (NSF) under Grants IIP-1440110.