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Article
Quantifying High-Density Connector Radiation in a Lossy Multisignal Environment
IEEE Transactions on Electromagnetic Compatibility
  • Matthew S. Halligan
  • Xinxin Tian
  • Xiao Li
  • Samuel R. Connor
  • Daryl G. Beetner, Missouri University of Science and Technology
  • James L. Drewniak, Missouri University of Science and Technology
Abstract

A method is presented to quantify the radiated power from a high-density connector. This method is based on network parameters and the principle of conservation of power. Unlike previous work, which assumed only radiated losses were present, the proposed method is able to characterize the radiated power in environments that contain material losses and when there are multiple signals at the printed circuit board/connector interface. The power losses are quantified through the definition of power loss constant matrices that can be used to find the power losses for arbitrary input excitations when the matrices are entirely known. The power loss constant matrices can be calculated through multiple single-port and two-port excitations for an N-port connector. The formulation of these excitations is dictated by the nonlinear properties of the power loss calculation. Simulations and measurements are presented that validate the proposed power loss calculation methodology.

Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
  • Connectors (structural),
  • Electromagnetic waves,
  • Interfaces (materials),
  • Printed circuits,
  • Reconfigurable hardware,
  • Scattering parameters,
  • Arbitrary inputs,
  • Constant matrix,
  • Material loss,
  • Network parameters,
  • Nonlinear properties,
  • Printed circuit boards (PCB),
  • Radiated power,
  • Simulations and measurements,
  • Printed circuit boards,
  • electromagnetic radiation
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2016 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
2-1-2016
Publication Date
01 Feb 2016
Citation Information
Matthew S. Halligan, Xinxin Tian, Xiao Li, Samuel R. Connor, et al.. "Quantifying High-Density Connector Radiation in a Lossy Multisignal Environment" IEEE Transactions on Electromagnetic Compatibility Vol. 58 Iss. 1 (2016) p. 270 - 277 ISSN: 0018-9375
Available at: http://works.bepress.com/daryl-beetner/81/