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Article
Spectroscopic ellipsometry study of optical anisotropy in Gd5Si2Ge2 and comparison with reflectance difference spectra
Physical Review B
  • Joong Mok Park, Iowa State University
  • David W. Lynch, Iowa State University
  • S. J. Lee, Iowa State University
  • Deborah L. Schlagel, Iowa State University
  • Thomas A. Lograsso, Iowa State University
  • A. O. Tsokol, Iowa State University
  • J. E. Snyder, Iowa State University
  • David C. Jiles, Iowa State University
Document Type
Article
Publication Date
1-9-2006
DOI
10.1103/PhysRevB.73.035110
Abstract
The complex dielectric functions of single crystals of Gd5Si2Ge2 were obtained using spectroscopic ellipsometry (SE) in the photon energy range of 1.5–5.0 eV at room temperature. Reflectance difference (RD) spectra for the a‐b and b‐c planes of single crystals of Gd5Si2Ge2 were derived from these dielectric functions and compared to those obtained from reflectance difference spectroscopy (RDS) at near-normal incidence. The two experimental RD spectra from SE and RDS agreed well. The in-plane optical anisotropy of the sample is mainly due to intrinsic bulk properties because of its larger magnitude (4×10−2) compared to surface-induced optical anisotropies, with a magnitude of only about 10−3 for a typical cubic material.
Comments

This article is from Physical Review B 73 (2006): 035110, doi:10.1103/PhysRevB.73.035110.

Copyright Owner
American Physical Society
Language
en
File Format
application/pdf
Citation Information
Joong Mok Park, David W. Lynch, S. J. Lee, Deborah L. Schlagel, et al.. "Spectroscopic ellipsometry study of optical anisotropy in Gd5Si2Ge2 and comparison with reflectance difference spectra" Physical Review B Vol. 73 Iss. 3 (2006) p. 035110
Available at: http://works.bepress.com/d_l_schlagel/82/