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Near-Field Scanning-Based Shielding Effectiveness Extraction for Board-Level Shielding Cans
IEEE Transactions on Electromagnetic Compatibility
  • Harsh Shrivastav
  • Takashi Enomoto
  • Shingo Seto
  • Kenji Araki
  • Chulsoon Hwang, Missouri University of Science and Technology
Abstract

The conventional definition of shielding effectiveness (SE) is well suited for calculations of far-field electromagnetic shielding. However, in the near field, SE calculations are not as straightforward. In radio-frequency interference (RFI) problems, the majority of field coupling occurs in the near field. Thus, a well-defined method for calculating the near-field SE is needed to estimate the suppression of RFI achieved by shielding cans. In this study, a method based on near-field scanning is developed to extract the SE of board-level shielding cans. The SE is defined by modeling the shielded noise source as equivalent dipole moments. The accuracy of the equivalent source is analyzed via the least-square error and correlation coefficient as confidence verification parameters. By applying the reciprocity theorem, the voltage coupled on a planar inverted F antenna from an unshielded and a shielded source is calculated. The coupled voltage from a shielded noise source serves as a reference to validate the effectiveness of the proposed method. Practical shielding cans were used to develop and validate the SE extraction method using full-wave 3D simulations and measurements.

Department(s)
Electrical and Computer Engineering
Keywords and Phrases
  • Antenna Measurements,
  • Correlation Coefficient,
  • Coupling,
  • Dipole Antennas,
  • Dipole Moment,
  • Integrated Circuit Modeling,
  • Magnetic Noise,
  • Magnetic Shielding,
  • Mathematical Model,
  • Near-Field Scanning,
  • Planar Inverted F Antenna (PIFA),
  • Radio Frequency,
  • Radio-Frequency Interference (RFI),
  • Reciprocity,
  • Shielding Effectiveness (SE)
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2021 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
1-1-2021
Publication Date
01 Jan 2021
Citation Information
Harsh Shrivastav, Takashi Enomoto, Shingo Seto, Kenji Araki, et al.. "Near-Field Scanning-Based Shielding Effectiveness Extraction for Board-Level Shielding Cans" IEEE Transactions on Electromagnetic Compatibility (2021) ISSN: 0018-9375; 1558-187X
Available at: http://works.bepress.com/chulsoon-hwang/94/