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Article
Analysis and Solution for RF Interference Caused by PMIC Noise in Mobile Platforms
IEEE Transactions on Electromagnetic Compatibility
  • Kiyeong Kim
  • Hwan Woo Shim
  • Chulsoon Hwang, Missouri University of Science and Technology
Abstract

Display modules have become inextricable components in recent mobile platforms; however, displays also represent the most common noise sources contributing to radio-frequency interference (RFI) issues. This paper considers RFI issues caused by power management integrated circuits (PMIC) that support display modules in practical mobile devices. The noise coupling from PMIC outputs to a mobile antenna is analyzed based on electromagnetic simulations and measurements. An alternative and practical method to evaluate the noise coupling is then suggested on the basis of transfer impedances of display power lines. Finally, a practical solution using selected multi-layer ceramic capacitors to improve the RFI issues is proposed and experimentally validated.

Department(s)
Electrical and Computer Engineering
Keywords and Phrases
  • Power Management Integrated Circuit (PMIC),
  • Radio-Frequency Interference (RFI),
  • Transfer Impedance
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2019 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
6-17-2019
Publication Date
17 Jun 2019
Citation Information
Kiyeong Kim, Hwan Woo Shim and Chulsoon Hwang. "Analysis and Solution for RF Interference Caused by PMIC Noise in Mobile Platforms" IEEE Transactions on Electromagnetic Compatibility Vol. 62 Iss. 3 (2019) p. 682 - 690 ISSN: 0018-9375; 1558-187X
Available at: http://works.bepress.com/chulsoon-hwang/89/