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A Compact and Wideband Electromagnetic Bandgap Structure using a Defected Ground Structure for Power/Ground Noise Suppression in Multilayer Packages and PCBs
IEEE Transactions on Electromagnetic Compatibility
  • Myunghoi Kim
  • Kyoungchoul Koo
  • Chulsoon Hwang, Missouri University of Science and Technology
  • Yujeong Shim
  • Joungho Kim
  • Jonghoon Kim
Abstract

In this paper, we propose a compact and wideband electromagnetic bandgap (EBG) structure using a defected ground structure (DGS) to significantly enhance the wideband suppression of power/ground noise coupling in multilayer packages and printed circuit boards. The proposed EBG structure is implemented simply by adding a rectangular-shaped DGS which is etched periodically onto the ground plane without changing any other geometrical parameter from a mushroom-type EBG structure. The DGS effects on the fL and fU are thoroughly analyzed using the dispersion characteristics. We experimentally verified that the proposed EBG structure achieved the wideband power/ground noise suppression (below 40 dB) between 2.5 and 16.2 GHz. In addition, we demonstrated the considerable reduction in fL from 3.4 to 2.5GHz and a significant increase in fU from 9.1 to 16.2 GHz when compared with the mushroom-type EBG structure.

Department(s)
Electrical and Computer Engineering
Keywords and Phrases
  • Defected Ground Structure,
  • Electromagnetic Bandgap,
  • Package,
  • Power/ground Noise,
  • Printed Circuit Board
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2012 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
6-1-2012
Publication Date
01 Jun 2012
Citation Information
Myunghoi Kim, Kyoungchoul Koo, Chulsoon Hwang, Yujeong Shim, et al.. "A Compact and Wideband Electromagnetic Bandgap Structure using a Defected Ground Structure for Power/Ground Noise Suppression in Multilayer Packages and PCBs" IEEE Transactions on Electromagnetic Compatibility Vol. 54 Iss. 3 (2012) p. 689 - 695 ISSN: 0018-9375
Available at: http://works.bepress.com/chulsoon-hwang/6/