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A 6.4Gbps On-Chip Eye Opening Monitor Circuit for Signal Integrity Analysis of High Speed Channel
Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2008, Detroit, MI)
  • Minchul Shin
  • Jongjoo Shim
  • Jaemin Kim
  • Jun-So Pak
  • Chulsoon Hwang, Missouri University of Science and Technology
  • Changwook Yoon
  • Joungho Kim
  • Hyungsoo Kim
  • Kunwoo Park
  • Yongju Kim
Abstract

In this paper, an on-chip eye opening monitor circuit has been proposed with 4ps time and 4mv voltage resolutions for analyzing signal integrity of on-chip high speed channel. The proposed eye opening monitor circuit can detect the maximum 6.4Gbps data rate and give eye diagrams depending on on-chip high speed channel conditions. The performance of the proposed eye opening monitor circuit was verified by using a general spice simulations and showed the variations of eye diagram of 6.4 Gbps random data when on-die terminations of on-chip high speed channel was changed from 50 ohm to 80 ohm.

Meeting Name
IEEE International Symposium on Electromagnetic Compatibility, EMC 2008 (2008: Aug. 18-22, Detroit, MI)
Department(s)
Electrical and Computer Engineering
International Standard Book Number (ISBN)
978-1-4244-1699-8
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 20018 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
8-22-2008
Publication Date
22 Aug 2008
Citation Information
Minchul Shin, Jongjoo Shim, Jaemin Kim, Jun-So Pak, et al.. "A 6.4Gbps On-Chip Eye Opening Monitor Circuit for Signal Integrity Analysis of High Speed Channel" Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2008, Detroit, MI) (2008) ISSN: 2158-110X
Available at: http://works.bepress.com/chulsoon-hwang/53/