Article
A 6.4Gbps On-Chip Eye Opening Monitor Circuit for Signal Integrity Analysis of High Speed Channel
Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2008, Detroit, MI)
Abstract
In this paper, an on-chip eye opening monitor circuit has been proposed with 4ps time and 4mv voltage resolutions for analyzing signal integrity of on-chip high speed channel. The proposed eye opening monitor circuit can detect the maximum 6.4Gbps data rate and give eye diagrams depending on on-chip high speed channel conditions. The performance of the proposed eye opening monitor circuit was verified by using a general spice simulations and showed the variations of eye diagram of 6.4 Gbps random data when on-die terminations of on-chip high speed channel was changed from 50 ohm to 80 ohm.
Meeting Name
IEEE International Symposium on Electromagnetic Compatibility, EMC 2008 (2008: Aug. 18-22, Detroit, MI)
Department(s)
Electrical and Computer Engineering
International Standard Book Number (ISBN)
978-1-4244-1699-8
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 20018 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
8-22-2008
Publication Date
22 Aug 2008
Disciplines
Citation Information
Minchul Shin, Jongjoo Shim, Jaemin Kim, Jun-So Pak, et al.. "A 6.4Gbps On-Chip Eye Opening Monitor Circuit for Signal Integrity Analysis of High Speed Channel" Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2008, Detroit, MI) (2008) ISSN: 2158-110X Available at: http://works.bepress.com/chulsoon-hwang/53/