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Article
De-Embedding Techniques for Transmission Lines: An Exploration, Review, and Proposal
Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2013, Denver, CO)
  • Nicholas C. Erickson
  • Ketan Shringarpure
  • Jun Fan, Missouri University of Science and Technology
  • Brice Achkir
  • Siming Pan
  • Chulsoon Hwang, Missouri University of Science and Technology
Abstract

In this paper, two transmission line based de-embedding techniques are reviewed for application in 3D IC measurements. In particular, full-wave models of extremely small stripline geometries are investigated. The advantages and drawbacks of each method are discussed in reference to simulation results, and a new hybrid method is proposed.

Meeting Name
IEEE International Symposium on Electromagnetic Compatibility, EMC 2013 (2013: Aug. 5-9, Denver, CO)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
  • Electromagnetic Compatibility,
  • Transmission Line Theory
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2013 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
8-1-2013
Publication Date
01 Aug 2013
Citation Information
Nicholas C. Erickson, Ketan Shringarpure, Jun Fan, Brice Achkir, et al.. "De-Embedding Techniques for Transmission Lines: An Exploration, Review, and Proposal" Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2013, Denver, CO) (2013) p. 840 - 845 ISSN: 1077-4076
Available at: http://works.bepress.com/chulsoon-hwang/20/