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Power Supply Induced Jitter (PSIJ) Modeling, Analysis, and Optimization of High Bandwidth Memory (HBM) I/O Interface
2023 IEEE Symposium on Electromagnetic Compatibility and Signal/Power Integrity, EMC+SIPI 2023
  • Hyunwook Park
  • Taein Shin
  • Seongguk Kim
  • Keeyoung Son
  • Keunwoo Kim
  • Boogyo Sim
  • Hyungmin Kang
  • Seonguk Choi
  • Jiwon Yoon
  • Hyunwoo Kim
  • Chulsoon Hwang, Missouri University of Science and Technology
  • Joungho Kim
Abstract

Power Supply Induced Jitter (PSIJ) in High Bandwidth Memory (HBM) I/O Interface is Modeled, Analyzed, and Optimized for Different HBM Generations. Precise Models for VDDQ Power Distribution Networks (PDNs), Simultaneous Switching Current (SSC), and Jitter Sensitivities of the Clock and I/O Buffers Are Implemented for PSIJ Estimation. Compared to the SPICE, the Average Error Rate of the Estimated PSIJ is 4.26 %. the Critical Frequency Bands in the Jitter Spectrum Where Large Jitters Occur Are Derived by Comparing the Relative Impact of the Modeled Interface Factors in the Frequency Domain. for the Optimization, On-Chip and On-Interposer Decoupling Capacitor (Decap) Placement Strategies using Machine Learning (ML) Are Applied. the Decap Effects in the Critical Ranges Are Analyzed. Finally, based on the Integrated Analysis of the Limitation of the Decap Solution and All the I/O Interface Factors, the Major Challenges of High-Frequency PSIJ Are Characterized.

Department(s)
Electrical and Computer Engineering
Comments

Ministry of Science, ICT and Future Planning, Grant NRF-2022M3I7A4072293

Keywords and Phrases
  • High bandwidth memory,
  • I/O interface,
  • Power Supply Induced Jitter
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2023 Institute of Electrical and Electronics Engineers, All rights reserved.
Publication Date
1-1-2023
Publication Date
01 Jan 2023
Citation Information
Hyunwook Park, Taein Shin, Seongguk Kim, Keeyoung Son, et al.. "Power Supply Induced Jitter (PSIJ) Modeling, Analysis, and Optimization of High Bandwidth Memory (HBM) I/O Interface" 2023 IEEE Symposium on Electromagnetic Compatibility and Signal/Power Integrity, EMC+SIPI 2023 (2023) p. 125 - 130
Available at: http://works.bepress.com/chulsoon-hwang/149/