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A Thermal-Aware DC-IR Drop Analysis for 2.5D IC
2023 IEEE Symposium on Electromagnetic Compatibility and Signal/Power Integrity, EMC+SIPI 2023
  • Shengxuan Xia
  • Baris M. Dogruoz
  • Yansheng Wang
  • Songping Wu
  • Siqi Bai
  • Chulsoon Hwang, Missouri University of Science and Technology
  • Zhonghua Wu
Abstract

With the Trend of Higher Integration, 3D/2.5D IC Solutions Such as CoWoS (Chip-On-Wafer-On-Substrate) Have Become More Popular in Recent Years. Power Integrity (PI) is Always a Critical Part of the Design Especially When the Power Consumption Requirements Are Important Specs for High-Performance Computing. DC-IR Drop is One of the Criteria within Power Integrity Considerations. However, Ordinary Electrical-Only Simulation for DC-IR Drop Will Be an Underestimation Because It Neglects the Copper Conductivity Dropping Due to the Temperature Rising. Thus, an Engineering Solution for Electrical-Thermal Co-Simulation is Important to Help to Provide Both an Accurate PI Analysis and the Proper Mitigations of the IR Drop Along the Power Rails. This Paper Uses a 2. 5D IC Chiplet as an Example to Conduct the Thermal-Aware DC-IR Simulation Workflow. by Iterating and Exchanging the Power Map and Temperature Map Files between an Electrical Simulator and a Thermal Simulator, Detailed Layer-By-Layer IR Drops and the Temperature Map Results Can Provide Good Insights for Efficiently Mitigating the IR Drop for PI by Establishing a Better Cooling Condition in Thermal Solution.

Department(s)
Electrical and Computer Engineering
Keywords and Phrases
  • 2.5D IC,
  • chiplet,
  • co-simulation,
  • DC-IR,
  • interposer,
  • package,
  • thermal
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2023 Institute of Electrical and Electronics Engineers, All rights reserved.
Publication Date
1-1-2023
Publication Date
01 Jan 2023
Citation Information
Shengxuan Xia, Baris M. Dogruoz, Yansheng Wang, Songping Wu, et al.. "A Thermal-Aware DC-IR Drop Analysis for 2.5D IC" 2023 IEEE Symposium on Electromagnetic Compatibility and Signal/Power Integrity, EMC+SIPI 2023 (2023) p. 670 - 675
Available at: http://works.bepress.com/chulsoon-hwang/142/