In this paper, modeling of RFI problem caused by a solid-state drive (SSD) in a laptop is proposed. Two noise sources (one outside and one inside a cavity) in the SSD are reconstructed as dipole moments with magnitude-only near-field scanning data. The dipole moment inside a cavity is then replaced by a Huygens' box covering four side surfaces of the cavity using a numerical simulation. The noise voltage at an RF antenna port is calculated by combining the two reconstructed noise sources with measured transfer functions. The model is successfully validated through a comparison of the calculation with measurement results.