The reverse-bias pulsed deep level transient spectroscopy (RDLTS) and a new temperature-dependent pulse-width RDLTS (TDP RDLTS) technique are reported to study the electric-field effect on carrier emission rates and the direct interaction between double DX centers recently detected in the Se:Al0.6Ga0.4As N confinement layer of the AlGaAs/GaAs single-quantum-well laser diodes. Traditional RDLTS measurements, with constant pulse width tp, prove that the two DX centers, Et1 and Et2, have strong direct emission interaction. Furthermore, the new TDP-RDLTS technique enables one to evaluate this direct transition time constant. Possible mechanisms for this interstate transition at different temperature ranges are provided and the new broadening effect due to this interstate transition is also reported here for the first time. Field-enhanced emission rates are calculated.