Skip to main content
Book
Hot-Carrier Effects in MOS Devices
Faculty Book Gallery
  • Eiji Takeda
  • Cary Y. Yang, Santa Clara University
  • Akemi Miura-Hamada
Role

Eiji Takeda (Author)

Cary Y. Yang (Author)

Akemi Miura-Hamada (Author)

Description

The exploding number of uses for ultrafast, ultrasmall integrated circuits has increased the importance of hot-carrier effects in manufacturing as well as for other technological applications. They are rapidly movingout of the research lab and into the real world.

This book is derived from Dr. Takedas book in Japanese, Hot-Carrier Effects, (published in 1987 by Nikkei Business Publishers). However, the new book is much more than a translation. Takedas original work was a starting point for developing this much more complete and fundamental text on this increasingly important topic. The new work encompasses not only all the latest research and discoveries made in the fast-paced area of hot carriers, but also includes the basics of MOS devices, and the practical considerations related to hot carriers.

ISBN
9780080926223
Publication Date
11-28-1995
Publisher
Academic Press
Citation Information
Eiji Takeda, Cary Y. Yang and Akemi Miura-Hamada. Hot-Carrier Effects in MOS Devices. (1995)
Available at: http://works.bepress.com/cary-yang/65/