Skip to main content
Article
Dislocation Dynamics Simulations of the Bauschinger Effect in Metallic Thin Films
Computational Materials Science
  • Caizhi Zhou, Missouri University of Science and Technology
  • Richard A. LeSar
Abstract

Three-dimensional dislocation dynamics simulations were used to examine the role of surface passivation on the plasticity of thin films. A simple line-tension model was used to model the dislocation transmission cross grain boundaries. We find that passivated thin films have a higher hardening rate and strength than freestanding films and that the hardening rate increases with decreasing film thickness. Under unloading, passivated films exhibit a significant Bauschinger effect in which reverse plastic flow occurs during unloading. The Bauschinger effect is enhanced by an increasing pre-strain or by decreasing the aspect ratio of the film. The reverse motion of dislocation pile-ups and the collapse of misfit dislocations were found to be responsible for the observed Bauschinger effect in passivated films. The predicted deformation behavior is in excellent agreement with that seen experimentally.

Department(s)
Materials Science and Engineering
Keywords and Phrases
  • Bauschinger Effect,
  • Grain Boundaries,
  • Passivation Layer,
  • Deformation Behavior,
  • Dislocation Dynamics Simulation,
  • Freestanding Films,
  • Metallic Thin Films,
  • Passivated Film,
  • Pile-Ups,
  • Pre-Strain,
  • Rate Increase,
  • Surface Passivation
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2012 Elsevier, All rights reserved.
Publication Date
3-1-2012
Publication Date
01 Mar 2012
Citation Information
Caizhi Zhou and Richard A. LeSar. "Dislocation Dynamics Simulations of the Bauschinger Effect in Metallic Thin Films" Computational Materials Science Vol. 54 Iss. 1 (2012) p. 350 - 355 ISSN: 0927-0256
Available at: http://works.bepress.com/caizhi-zhou/16/