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Article
Direct Comparison Between Phase Locked Oscillator and Direct Resonance Oscillator in the Noncontact Atomic Force Microscopy Under Ultrahigh Vacuum
Review of Scientific Instruments
  • Byung I. Kim, Boise State University
Document Type
Article
Publication Date
11-3-2004
Disciplines
Abstract
I have demonstrated the advantage of the phase locked oscillator (PLO) over the conventional direct resonance oscillator (DRO) in noncontact mode atomic force microscopy (AFM) under ultrahigh vacuum. Direct comparison between PLO and DRO has been made in terms of background noise level, temporal response, and stability. Compared to the DRO method without phase coherence, the experimental results show that the PLO method is more effective in reducing the noise level and enhancing the stability over all force regimes in UHV noncontact AFM. The noise reduction and stability enhancement in PLO indicate the important role of the phase coherent effect in improving the capability of noncontact imaging in UHV.
Copyright Statement

This document was originally published by the American Institute of Physics in Review of Scientific Instruments. Copyright restrictions may apply. DOI: 10.1063/1.1806998

Citation Information
Byung I. Kim. "Direct Comparison Between Phase Locked Oscillator and Direct Resonance Oscillator in the Noncontact Atomic Force Microscopy Under Ultrahigh Vacuum" Review of Scientific Instruments (2004)
Available at: http://works.bepress.com/byung_kim/2/