The electronic etching and characterization of Tungsten tips in preparation for productionAndrews Research Conference
LocationCSH Room 108
Start Date8-5-2014 11:00 AM
End Date8-5-2014 11:30 AM
Presentation AbstractThe ability of high school students as well as small higher education institutions to perform valuable research is usually limited by the cost of equipment and supplies. With the advent of cheaper and more robust Atomic force microscopes the cost of spm probes becomes more of a limiting factor. We are able to individually produce etched tungsten probes that should be able to be mounted in an atomic force microscope and be used as a cheap training and measurement tip.
Citation InformationG. Brendan Cross. "The electronic etching and characterization of Tungsten tips in preparation for production" (2014)
Available at: http://works.bepress.com/brendan_cross/1/