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Recombination Luminescence from "Hot" Carriers in Electron-Hole Droplets in Stressed Ge
Physical Review Letters (1977)
  • H.-H. Chou, Northwestern University
  • George K. Wong, Northwestern University
  • Bernard J. Feldman, University of Missouri–St. Louis
Abstract
We have observed luminescence lines from "hot" free excitons and from recombination of "hot" electrons within electron-hole droplets in Ge under uniform ⟨111⟩ uniaxial stress. Our results suggest that both "hot" and "cold" electrons coexist in the same electron-hole droplets. We have also measured the total lifetime of the hot electrons, which is in good agreement with intervalley relaxation by electron-electron scattering.
Publication Date
January 1, 1977
Citation Information
H.-H. Chou, George K. Wong and Bernard J. Feldman. "Recombination Luminescence from "Hot" Carriers in Electron-Hole Droplets in Stressed Ge" Physical Review Letters (1977)
Available at: http://works.bepress.com/bernard-feldman/80/