Article
Iron doped amorphous hydrogenated carbon nitride
Solid State Communications
(1989)
Abstract
Amorphous carbon nitride iron-containing thin films have been grown from the plasma decomposition of a feedstock of CH4, N2, and H2. From Auger Electron Spectroscopy, these films contain C, N, O, Fe and a small amount of Cr and Ni. The presence of Fe, Cr and Ni is due to sputtering of the stainless steel cathode. From Hall and thermopower measurements, these films are p-type degenerate semiconductors. From transmission electron microscopy, these films contain microcrystallites of FeO embedded in an amorphous matrix.
Disciplines
Publication Date
September 1, 1989
DOI
10.1016/0038-1098(89)90200-7
Citation Information
He-Xiang Han, Bernard J. Feldman, G. Fraundorf and P. Fraundorf. "Iron doped amorphous hydrogenated carbon nitride" Solid State Communications Vol. 71 Iss. 10 (1989) p. 801 - 803 Available at: http://works.bepress.com/bernard-feldman/47/