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Electron Spin Resonance Studies in Amorphous Boron Nitride Films
Annual March Meeting (1996)
  • Ian W. M. Brown, University of Missouri–St. Louis
  • Spencer Lin
  • Bernard J. Feldman, University of Missouri–St. Louis
ESR measurements confirm the existence of a nanocrystalline phase as well as an amorphous phase in boron nitride films grown by plasma-assisted chemical vapor deposition. The three observed spectra consist of a four-line component and a ten-line component superimposed on a broad single line. These hyperfine structures are assigned to a one-boron and a three-boron defect center located in the nanocrystalline regions whereas the single-line is associated with dangling bonds in the amorphous regions. Changes in the three spectra resulting from uv-irradiation and isothermal annealing will be reported.
Publication Date
January 1, 1996
Citation Information
Ian W. M. Brown, Spencer Lin and Bernard J. Feldman. "Electron Spin Resonance Studies in Amorphous Boron Nitride Films" Annual March Meeting (1996)
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