Skip to main content
Far From Threshold Buckling Analysis of Thin Films
  • B Davidovitch, University of Massachusetts - Amherst
  • R Schroll, University of Massachusetts - Amherst
  • D. Vella
  • M. Adda-Bedia
  • E. Cerda

Thin films buckle easily and form wrinkled states in regions of well defined size. The extent of a wrinkled region is typically assumed to reflect the zone of in-plane compressive stresses prior to buckling, but recent experiments on ultrathin sheets have shown that wrinkling patterns are signif- icantly longer and follow different scaling laws than those predicted by standard buckling theory. Here we focus on a simple setup to show the striking differences between near-threshold buckling and the analysis of wrinkle patterns in very thin films, which are typically far from threshold.

Publication Date
January 1, 2010
This is the pre-published version harvested from ArXiv.
Citation Information
B Davidovitch, R Schroll, D. Vella, M. Adda-Bedia, et al.. "Far From Threshold Buckling Analysis of Thin Films" (2010)
Available at: