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Combined Kerr microscope and magnetic force microscope for variable temperature ultrahigh vacuum investigations
Axel Enders Publications
  • D. Peterka, Max-Planck-Institute for Solid State Physics
  • Axel Enders, University of Nebraska-Lincoln
  • G. Haas, Max-Planck-Institute for Solid State Physics
  • Klaus Kern, Max-Planck-Institute for Solid State Physics
Date of this Version
1-1-2003
Disciplines
Comments

Published in REVIEW OF SCIENTIFIC INSTRUMENTS, VOLUME 74, NUMBER 5 MAY 2003. DOI: 10.1063/1.1568556 © 2003 American Institute of Physics. Used by permission.

Abstract

A new system combining a Kerr microscope and a magnetic force microscope for the study of magnetic domains in ultrathin films under ultrahigh vacuum conditions is presented. Due to the overlapping imaging range of both techniques magnetic domains can be investigated over a lateral range from millimeter down to fractions of a micrometer. Experiments can be done at variable temperatures, from 80 K to 600 K. First results are presented showing the same magnetic domain in a three monolayer Fe film on Cu (100) imaged with both techniques.

Citation Information
D. Peterka, Axel Enders, G. Haas and Klaus Kern. "Combined Kerr microscope and magnetic force microscope for variable temperature ultrahigh vacuum investigations" (2003)
Available at: http://works.bepress.com/axel_enders/15/