Skip to main content
Article
Investigations on TiO2 and Ag based single and multilayer films for window glazings
Journal of Engineering and Applied Sciences (2010)
Abstract

In this investigation, TiO2 and Ag based single and multilayer-films were deposited on microscope glass slides with varying individual layer thicknesses by radio-frequency reactive magnetron sputtering. Prior to multilayer development, single layers of Ag and TiO2 were deposited and characterized. All the films were prepared at an elevated pressure of 3 Pa at room temperature. It was found that single layer of TiO2 showed anatase polycrystalline structure. It also exhibited high visible transmittance of above 80% and higher refractive index of 2.31 at a wavelength of 550 nm. The indirect optical band gap of the TiO2 films was estimated as 3.39 eV. The Ag single layer films were found to be crystalline with a very high reflectance for IR (Infra-red) light. Finally, the multi-layers have been deposited and characterized by X-ray diffraction, UV-visible-NIR spectro-photometry, scanning electron microscopy and Auger electron spectroscopy. © 2006-2010 Asian Research Publishing Network (ARPN). All rights reserved.

Keywords
  • Dielectric material,
  • Multilayer coatings,
  • Optical properties,
  • Structural properties,
  • Window glazing
Publication Date
2010
Citation Information
"Investigations on TiO2 and Ag based single and multilayer films for window glazings" Journal of Engineering and Applied Sciences Vol. 5 Iss. 9 (2010)
Available at: http://works.bepress.com/asmd_haseeb/31/