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Article
A Fault Analytic Method Against HB+
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
  • José Carrijo
  • Rafael Tonicelli
  • Anderson C.A. Nascimento, University of Washington Tacoma
Publication Date
1-1-2011
Document Type
Article
Abstract

The search for lightweight authentication protocols suitable for low-cost RFID tags constitutes an active and challenging research area. In this context, a family of protocols based on the LPN problem has been proposed: the so-called HB-family. Despite the rich literature regarding the cryptanalysis of these protocols, there are no published results about the impact of fault analysis over them. The purpose of this paper is to fill this gap by presenting a fault analytic method against a prominent member of the HB-family: HB+ protocol. We demonstrate that the fault analysis model can lead to a flexible and effective attack against HB-like protocols, posing a serious threat over them.

DOI
10.1587/transfun.E94.A.855
Publisher Policy
publisher's pdf
Citation Information
José Carrijo, Rafael Tonicelli and Anderson C.A. Nascimento. "A Fault Analytic Method Against HB+" IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences Vol. E94-A Iss. 2 (2011) p. 855 - 859
Available at: http://works.bepress.com/anderson-nascimento/3/