Article
A Device for Surface Spectroscopic Study of Micron Thin Films
Polymer Science Faculty Research
Document Type
Article
Publication Date
10-1-2002
Disciplines
Abstract
A device to probe the molecular structure of materials next to a solid interface in a thin film geometry has been developed. The device can produce controlled thicknesses as small as 1 μm with parallelity better than 0.003°. We have shown that the thickness and the parallelity of the film produced between two optical surfaces can be quantified using white light and monochromatic light interferometry, respectively. In addition, this apparatus allows the study of these films in a static state or under shear using spectroscopic techniques involving transmission or reflection measurements.
Citation Information
Ali Dhinojwala. "A Device for Surface Spectroscopic Study of Micron Thin Films" Vol. 73 (2002) Available at: http://works.bepress.com/ali_dhinojwala/40/