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Article
Near-Field Intensity Correlations in Semicontinuous Metal Films
Proceedings of the 2005 Quantum Electronics and Laser Science Conference
  • K. Seal
  • H. Noh
  • Alexey Yamilov, Missouri University of Science and Technology
  • A. K. Sarchev
  • D. A. Genov
  • V. M. Shalaev
  • Z. C. Ying
  • Hui Cao
Abstract
Spatial intensity correlation functions of semicontinuous metal-dielectric films of varying metal concentration, p, were obtained from near-field microscopy. The data shows a transition from propagation to localization and back to propagation of optical excitations with increase in p.
Meeting Name
2005 Quantum Electronics and Laser Science Conference
Department(s)
Physics
Keywords and Phrases
  • Dielectric Thin Films,
  • Discontinuous Metallic Thin Films,
  • Metal Concentration,
  • Near-Field Intensity Correlations,
  • Near-Field Microscopy,
  • Near-Field Scanning Optical Microscopy,
  • Optical Excitations,
  • Polaritons,
  • Semicontinuous Metal-Dielectric Films,
  • Spatial Intensity Correlation Functions,
  • Surface Plasmons
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2005 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
1-1-2005
Disciplines
Citation Information
K. Seal, H. Noh, Alexey Yamilov, A. K. Sarchev, et al.. "Near-Field Intensity Correlations in Semicontinuous Metal Films" Proceedings of the 2005 Quantum Electronics and Laser Science Conference (2005)
Available at: http://works.bepress.com/alexey-yamilov/20/