Article
Theoretical and Experimental Analysis of VDP Sensors for Use in Die Stress Measurements
Proceedings of the SEM Annual Conference on Theoretical Experimental and Computational Mechanics
Document Type
Conference Proceeding
Publication Date
1-1-1999
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Citation Information
Ahsan Mian, Jeffrey C. Suhling and Richard C. Jaeger. "Theoretical and Experimental Analysis of VDP Sensors for Use in Die Stress Measurements" Proceedings of the SEM Annual Conference on Theoretical Experimental and Computational Mechanics (1999) p. 76 - 80 Available at: http://works.bepress.com/ahsan-mian/69/
Presented at the SEM Annual Conference on Theoretical, Experimental and Computational Mechanics, Cincinnati, OH, June 7-9, 1999