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Effective Grain Pinning Revealed by Nanoscale Electron Tomography

Y. Q. Wu, Iowa State University
W. Tang, Iowa State University
K. W. Dennis, Iowa State University
N. Oster, Iowa State University
R. W. McCallum, Iowa State University
I. E. Anderson, Iowa State University
M. J. Kramer, Iowa State University

Suggested Citation

Y. Q. Wu, W. Tang, K. W. Dennis, N. Oster, R. W. McCallum, I. E. Anderson, and M. J. Kramer. "Effective Grain Pinning Revealed by Nanoscale Electron Tomography" 55th Annual Conference on Magnetism & Magnetic Materials. Atlanta, Georgia, USA. Nov. 2010.



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