After working for Hewlett Packard Labs and Insight Analytical Labs, Dr. William B. Knowlton joined the faculty in Electrical and Computer Engineering at Boise State University in 2000. He has a B.S, an M.S., and a Ph.D.in materials science and engineering from the University of California at Berkeley. After coming to Boise State, he co-developed five new programs and a department in Materials Science and Engineering where he holds a joint appointment as a professor. He has established two research laboratories and co-established another, brought more than $16.5M in funding to Boise State, and has published over 70 papers in peer reviewed journals or conferences. Dr. Knowlton's research activities include device reliability physics, materials characterization, nanofabrication, biomaterials, magnetic materials and molecular electronic devices, and he and his colleagues have developed a collaborative, multidisciplinary research cohort in which they share ideas, students, and resources.
Articles & Conference Proceedings
Transformation Volume Strain in Ni-Mn-Ga Thin Films (with I. R. Aseguinolaza, I. Reyes-Salazar, A. V. Svalov, K. Wilson, P. Müllner, J. M. Barandiar, E. Villa, and V. A. Chernenko), Applied Physics Letters (2012)
The temperature dependences of the lattice parameters and residual stress have been measured for a...
DNA-Controlled Excitonic Switches (with Elton Graugnard, Donald L. Kellis, Hieu Bui, Stephanie Barnes, Wan Kuang, Jeunghoon Lee, William L. Hughes, and Bernard Yurke), Nano Letters (2012)
Fluorescence resonance energy transfer (FRET) is a promising means of enabling information processing in nanoscale...
Cryogenic to Room Temperature Effects of NBTI in High-k PMOS Devices (with Richard G. Southwick III, Shem T. Purnell, Carey M. Rappaport, Blake Rapp, Ryan J. Thompson, Shane K. Pugmire, Ben Kaczer, and Tibor Grasser), 2011 IEEE International Integrated Reliability Workshop Final Report (IRW) (2011)
We present experimental evidence that trapping mechanisms contributing to the negative bias temperature instability (NBTI)...
A Physical Model of the Temperature Dependence of the Current Through SiO2/HfO2 Stacks (with L. Vandelli, A. Padovani, L. Larcher, Richard G. Southwick III, and Gennadi Bersuker), IEEE Transactions on Electron Devices (2011)
In this paper, we investigate the characteristics of the defects responsible for the leakage current...
An Interactive Simulation Tool for Complex Multilayer Dielectric Devices (with Richard G. Southwick III, Aaron Sup, and Amit Jain), IEEE Transactions on Device and Materials Reliability (2011)
Novel devices incorporating multiple layers of new materials increase the complexity of device structures, particularly...
Presentations
DNA as an Engineered Material (with William L. Hughes, Bernard Yurke, Elton Graugnard, Jeunghoon Lee, Wan Kuang, and Cheryl Jorcyk), 10th Annual Idea Network of Biomedical Research Excellence (INBRE) Conference (2011)
Characterization of ZnO Thin Films Grown by Spray Pyrolysis Using Various Chemical Precursors (with Jason Brotherton, Theron Fereda, Pamela Walker, Jerry Harris, and Aaron Thurber), College of Engineering Poster Presentations (2010)
Zinc oxide (ZnO) has gained much interest recently due to its semiconductivity, optical transparency, and...
Cryogenic Characterization of Charge Trapping in MOSFET High-k Dielectrics (with Ross Butler and Richard G. Southwick III), College of Engineering Poster Presentations (2010)
Electron or hole carrier trapping by lattice point defects in metal oxide silicon field effect...
Multi-Scale Mechanical Property Evaluation of Soft Materials (with Jonathan Henderson, Chad Watson, William L. Hughes, and Julia T. Oxford), College of Engineering Poster Presentations (2010)
Comprehensive evaluation of the biomechanical properties associated with the initiation of joint-related diseases is needed...
Radial Dielectrophoretic Trap for Individual Nanostructures (with Stephanie Barnes, Christopher Buu, Jason Brotherton, Hieu Bui, Austin Johnson, Mallory Yates, Wan Kuang, Jeunghoon Lee, William L. Hughes, and Bernard Yurke), College of Engineering Poster Presentations (2010)
Dielectrophoresis (DEP) is a method of trapping micro- and nano-sized particles using non-uniform electric fields....