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Article
Measurements of the longitudinal wave speed in thin materials using a wideband PVDF transducer
Journal of the Acoustical Society of America (2003)
  • Kwang Yul Kim, Cornell University
  • Wei Zou, Cornell University
  • Stephen D. Holland, Cornell University
  • Wolfgang Sachse, Cornell University
Abstract

A flat transducer was constructed, using a 9-mm-thick PVDF (polyvinylidene fluoride) film for generation and detection of high-frequency ultrasonic waves, and used for measurements of the phase velocity of longitudinal waves traveling along the thickness direction in a very thin material. The transducer has a useful wideband frequency characteristic extending from 10 MHz to over 150 MHz. Measurements of the phase velocity of the longitudinal waves are carried out using a 0.212-mm-thick glass slide and a 0.102-mm-thick stainless-steel shim, using water as a coupling medium. The thickness limit for this measurement appears to be approximately 20 mm. The phase velocity of the longitudinal mode is obtained as a function of frequency in the frequency domain by using a modified sampled continuous wave (cw) technique. It can also be measured in the time domain by using a broadband pulse of short duration.

Publication Date
September, 2003
Publisher Statement
This article is from Journal of the Acoustical Society of America 114, no. 3 (2003): 1450–1453, doi:10.1121/1.1562650.
Citation Information
Kwang Yul Kim, Wei Zou, Stephen D. Holland and Wolfgang Sachse. "Measurements of the longitudinal wave speed in thin materials using a wideband PVDF transducer" Journal of the Acoustical Society of America Vol. 114 Iss. 3 (2003)
Available at: http://works.bepress.com/stephen_holland/48/