Initial results have been recently reported that suggest a potential correlation exists between the full-width-halfmaximum (FWHM) of the Y(3d) peak obtained by x-ray photoelectron spectroscopy (XPS) and the critical current density a YBa2Cu3O7-x film can carry. In particular, the Y(3d5/2) demonstrated a stronger correlation. Transport currents were determined by the 4-point contact method using the 1μV/cm criterion. An apparent correlation was also suggested between the Y(3d) FWHM and ac loss data points were acquired to further test the usefulness of the correlations. Samples were created by pulsed laser deposition of YBa2Cu3O7-x on LaAlO3 substrates.