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In-situ high-energy x-ray diffraction study of the local structure of supercooled liquid Si
Physical Review of Letters (2005)
  • Robert Hyers, University of Massachusetts - Amherst
  • A. I Goldman
  • K. F Kelton
  • D. S Robinson
  • J. R Rogers
  • T. J Rathz
  • A. K Gangopadhyay
  • B. Sieve
  • G. W Lee
  • T. H Kim
Abstract

Employing the technique of electrostatic levitation, coupled with high-energy x-ray diffraction and rapid data acquisition methods, we have obtained high quality structural data more deeply into the supercooled regime of liquid silicon than has been possible before. No change in coordination number is observed in this temperature region, calling into question previous experimental claims of structural evidence for the existence of a liquid-liquid phase transition.

Publication Date
August, 2005
Publisher Statement
DOI:10.1103/PhysRevLett.95.085501
Citation Information
Robert Hyers, A. I Goldman, K. F Kelton, D. S Robinson, et al.. "In-situ high-energy x-ray diffraction study of the local structure of supercooled liquid Si" Physical Review of Letters Vol. 95 (2005)
Available at: http://works.bepress.com/robert_hyers/1/