"Comments submitted to the US Patent Office on enhancing the quality of examination" by Ron D Katznelson

Selected Works of Ron D. Katznelson

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Presentation

Comments submitted to the US Patent Office on enhancing the quality of examination

(2010)

Ron D Katznelson, Bi-Level Technologies

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Keywords

Patent Quality,
Examination Quality,
Allowance Errors,
Rejection Errors,
Probability of Error,
L1 Estimation

Disciplines

Applied Mathematics,
Intellectual Property Law,
Law and
Statistics and Probability

Publication Date

March 8, 2010

Citation Information

Ron D Katznelson. "Comments submitted to the US Patent Office on enhancing the quality of examination" (2010)
Available at: http://works.bepress.com/rkatznelson/62/