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Unpublished Paper
My 2010 wishes for the U.S. Patent Examiner
(2010)
  • Ron D Katznelson, Bi-Level Technologies
Keywords
  • Patent Examination,
  • Allowance Error Rate,
  • Patent Quality,
  • Patent Office,
  • Patent Pendency
Publication Date
January 8, 2010
Citation Information
Ron D Katznelson. "My 2010 wishes for the U.S. Patent Examiner" (2010)
Available at: http://works.bepress.com/rkatznelson/60/