Separation modes in microcontacts identified by the rate dependence of the pull-off force

L. Chen, RF Micro Devices, Inc.
N. E. McGruer, Northeastern University
G. G. Adams, Northeastern University
Y. Du, Qualcomm Corporation

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Originally published in Applied Physics Letters, v.93 no.5 (2008). DOI:10.1063/1.2967855

Abstract

We report the observation of two distinct modes of rate-dependent behavior during contact cycling tests. One is a higher pull-off force at low cycling rates and the other is a higher pull-off force at high cycling rates. Subsequent investigation of these contacts using scanning electron microscopy (SEM) demonstrates that these two rate-dependent modes can be related to brittle and ductile separation modes. The former behavior is indicative of brittle separation, whereas the latter accompanies ductile separation. Thus by monitoring the rate dependence of the pull-off force, the type of separation mode can be identified during cycling without interrupting the test to perform SEM.