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Article
Resonant Dielectronic and Direct Excitation in Crystal Channels
Physical Review Letters
  • Sheldon Datz
  • Charles Randy Vane
  • Peter F. Dittner
  • J. P. Giese
  • J. C. Gomez Del Campo
  • N. L. Jones
  • Herbert F. Krause
  • Philip D. Miller
  • Michael Schulz, Missouri University of Science and Technology
  • Harald Schone
  • Thomas M. Rosseel
Abstract

We have observed dielectronic and direct excitation of H-like S15+ and Ca19+ and He-like Ti20+ ions in silicon channels caused by collision with weakly bound target electrons which behave as a free-electron gas. As in vacuo, relaxation of the doubly excited states can occur radiatively leading to ions of decreased charge, but in a crystal channel collisional effects can cause double ionization. The effects are seen in both the x-ray yields and charge-state fractions, and, in the case of Ti20+, in charge-state x-ray coincidences.

Department(s)
Physics
Document Type
Article - Journal
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 1989 American Physical Society (APS), All rights reserved.
Publication Date
8-1-1989
Publication Date
01 Aug 1989
Disciplines
Citation Information
Sheldon Datz, Charles Randy Vane, Peter F. Dittner, J. P. Giese, et al.. "Resonant Dielectronic and Direct Excitation in Crystal Channels" Physical Review Letters Vol. 63 Iss. 7 (1989) p. 742 - 745 ISSN: 0031-9007
Available at: http://works.bepress.com/michael-schulz/108/