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Selected Works of Andres H. La Rosa
Article
Near-field scanning optical microscopy for characterization of photovoltaic materials
Physica Status Solidi (2004)
  • E. E. van Dyk
  • A. Karoui, North Carolina State University at Raleigh
  • Andres H. La Rosa, Portland State University
  • G. Rozgonyi, North Carolina State University at Raleigh
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Abstract
Near-field scanning optical microscopy (NSOM) enables nanometer scale studies of optical and opto-electronic properties. A NSOM setup has been designed and constructed to investigated carrier lifetime in the vicinity of extended defects such as grain boundaries and dislocations, as well as surface topography in photovoltaic materials. The benefits of the NSOM technique and the different modes employed are discussed. Some preliminary results are presented.
Disciplines
Publication Date
2004
Citation Information
E. E. van Dyk, A. Karoui, Andres H. La Rosa and G. Rozgonyi. "Near-field scanning optical microscopy for characterization of photovoltaic materials" Physica Status Solidi Vol. 9 (2004)
Available at: http://works.bepress.com/la_rosa/19/