Presentation
Electron Microscopic Observations of Interfacial Voids in Aluminum Created by Alkaline Dissolution
Chemical and Biological Engineering Conference Presentations and Proceedings
Document Type
Conference Proceeding
Disciplines
Conference
212th ECSMeeting
Publication Date
1-1-2007
DOI
10.1149/1.2899051
Geolocation
(38.9071923, -77.03687070000001)
Abstract
We report evidence from electron microscopy and positron annihilation spectroscopy (PAS) for the formation by alkaline dissolution of nm-scale voids in aluminum near the metal-oxide interface. Imaging was carried out using transmission electron microscopy (TEM), scanning transmission electron microscopy (STEM) and field emission scanning electron microscopy (FESEM). EM images supported the PAS finding that voids were found within tens of nm of the interface, and revealed that the void number density increased by at least 10 times due to dissolution. From TEM, void number densities were on the order of 108 cm-2. From TEM and SEM, voids appeared circular in cross-section and were ~ 20 nm in diameter.
Rights
© The Electrochemical Society, Inc. 2008. All rights reserved. Except as provided under U.S. copyright law, this work may not be reproduced, resold, distributed, or modified without the express permission of The Electrochemical Society (ECS).
Copyright Owner
The Electrochemical Society
Copyright Date
2008
Language
en
Citation Information
Saikat Adhikari, L. Scott Chumbley, H. Chen, Y. C. Jean, et al.. "Electron Microscopic Observations of Interfacial Voids in Aluminum Created by Alkaline Dissolution" Washington, D.C.(2007) Available at: http://works.bepress.com/kurtr_hebert/45/
The archival version of this work was published in S. Adhikari, L. S. Chumbley, H. Chen, Y. C. Jean, A. C. Geiculescu and K. R. Hebert, "Electron Microscopic Observations of Interfacial Voids in Aluminum Created by Alkaline Dissolution," ECS Trans. 11 (15) 99-107 (2008). doi:10.1149/1.2899051