Article
A CN-FDTD Scheme and Its Application to VLSI Interconnects/Substrate Modeling
Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2004, Santa Clara, CA)
Abstract
In this paper, a two-dimensional (2D) Crank-Nicholason (CN) finite difference time domain (FDTD) method is proposed for VLSI interconnect/substrate characterization. Through rigorous truncation and dispersion error analyses, a guideline on using this technique is presented. Several iterative solvers are investigated to accelerate the solution of the CN-FDTD scheme. Numerical examples are given to demonstrate the accuracy and the efficiency of the proposed algorithm.
Meeting Name
IEEE International Symposium on Electromagnetic Compatibility (2004: Aug. 9-13, Santa Clara, CA)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
- 2D FDTD Method,
- CN-FDTD Scheme,
- Crank-Nicholason Method,
- VLSI,
- VLSI Interconnect/Substrate Characterization,
- Dispersion Error Analysis,
- Finite Difference Time Domain Method,
- Finite Difference Time-Domain Analysis,
- Integrated Circuit Interconnections,
- Integrated Circuit Modelling,
- Iterative Methods,
- Iterative Solvers,
- Truncation Error Analysis,
- Two-Dimensional FDTD Method,
- Very Large Scale Integration,
- Finite Difference Methods,
- Time Domain Analysis,
- Finite Wordlength Effects,
- Error Analysis,
- Magnetic Analysis,
- Iterative Algorithms,
- Equations
International Standard Book Number (ISBN)
780384431
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2004 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
8-1-2004
Publication Date
01 Aug 2004
Disciplines
Citation Information
Rui Qiang, Dagang Wu, Ji Chen, Chen Wang, et al.. "A CN-FDTD Scheme and Its Application to VLSI Interconnects/Substrate Modeling" Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2004, Santa Clara, CA) Vol. 1 (2004) p. 97 - 101 ISSN: 1077-4076 Available at: http://works.bepress.com/james_wu_lvhn/42/