Article
Superfast phase-shifting method for 3-D shape measurement
Optics Express
Document Type
Article
Disciplines
Publication Date
1-1-2010
DOI
10.1364/OE.18.009684
Abstract
Recently introduced DLP Discovery technology allows for tens of kHz binary image switching, which has great potential for superfast 3-D shape measurement. This paper presents a system that realizes 3-D shape measurement by using a DLP Discovery technology to switch binary structured patterns at very high frame rates. The sinusoidal fringe patterns are generated by properly defocusing the projector. Combining this approach with a phase-shifting method, we achieve an unprecedented rate for 3-D shape measurement: 667 Hz. This technology can be applied to numerous applications including medical science, biometrics, and entertainment.
Copyright Owner
OSA
Copyright Date
2010
Language
en
File Format
application/pdf
Citation Information
Song Zhang, Daniel Van Der Welde and James H. Oliver. "Superfast phase-shifting method for 3-D shape measurement" Optics Express Vol. 18 Iss. 9 (2010) p. 9684 - 9689 Available at: http://works.bepress.com/james_oliver/10/
This paper was published in Optics Express and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://dx.doi.org/10.1364/OE.18.009684. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.