"A New Method for Electrical Characterization of Ferroelectric Thin Films at Microwave Frequencies" by Guru Subramanyam

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A New Method for Electrical Characterization of Ferroelectric Thin Films at Microwave Frequencies

Ferroelectrics

Guru Subramanyam, University of Dayton

Link

Document Type

Article

Publication Date

1-1-2007

Abstract

Read More: http://www.worldscientific.com/doi/abs/10.1142/S179329200900154X

Inclusive pages

153-157

ISBN/ISSN

0015-0193

Publisher

Taylor & Francis Group

Peer Reviewed

Yes

Keywords

Varactor shunt switches,
capacitive test structure,
microwave characterization of ferroelectric thin films

Disciplines

Electrical and Computer Engineering,
Electronic Devices and Semiconductor Manufacturing and
Nanotechnology Fabrication

Citation Information

Guru Subramanyam. "A New Method for Electrical Characterization of Ferroelectric Thin Films at Microwave Frequencies" Ferroelectrics Vol. 356 Iss. 1 (2007)
Available at: http://works.bepress.com/guru_subramanyam/35/