Growth and characterization of thick oriented barium hexaferrite films on MgO (111) substrates
Originally published in Applied Physics Letters 76, 3612 (2000). DOI:10.1063/1.126723 (http://dx.doi.org/10.1063/1.126723).
Highly oriented films of BaFe₁₂O₁₉ have been deposited onto MgO (111) substrates by pulsed laser ablation deposition. In contrast to epitaxial BaFe₁₂O₁₉ films grown on Al₂O₃ (001) substrates, these films experience an in-plane biaxial compressive stress, and do not crack or delaminate to thicknesses of at least 28 μm. X-ray diffraction, magnetometry, torque magnetometry, and ferrimagnetic resonance results all indicate excellent c-axis orientation normal to the film plane, and magnetic properties comparable to bulk values. The thickness and properties of these films approach those required for applications in low-loss self-biased nonreciprocal microwave devices
S. A. Oliver, S. D. Yoon, I Kozulin, M. L. Chen, and C. Vittoria. "Growth and characterization of thick oriented barium hexaferrite films on MgO (111) substrates" Electrical and Computer Engineering Faculty Publications (2000).
Available at: http://works.bepress.com/cvittoria/91