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Article
Deformation of single crystal sample using D-DIA apparatus coupled with synchrotron X-rays: In-situ stress and strain measurements at high pressure and temperature
Journal of Physics and Chemistry of Solids (2010)
  • Jennifer Girard
  • Jiuhua Chen
  • Paul Raterron
  • Caleb Holyoke
Publication Date
2010
DOI
10.1016/j.jpcs.2010.03.005
Citation Information
Jennifer Girard, Jiuhua Chen, Paul Raterron and Caleb Holyoke. "Deformation of single crystal sample using D-DIA apparatus coupled with synchrotron X-rays: In-situ stress and strain measurements at high pressure and temperature" Journal of Physics and Chemistry of Solids (2010)
Available at: http://works.bepress.com/caleb_holyoke/6/