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Presentation
Increasing Measurement Precision Using a Subdimensional Item Response Model Approach
American Educational Research Association (AERA) Annual Meeting (2013)
  • Steffen Brandt
  • Brent M Duckor, San Jose State University
Abstract
In recent years IRT models have focused on the estimation of unidimensional abilities for instruments with sub-tests. While both testlet and higher-order models address potential local item dependence, a generalized subdimension model (GSM) allows for the construction of a unidimensional ability estimate while assuming multidimensional latent variables. This paper extends the model beyond the use of dichotomous data in large-scale test batteries to include partial credit data in order to check whether it yields comparable results in small-scale assessment data with only constructed response items. The GSM results yield accurate estimates for partial credit data; the increase in measurement precision in comparison to the unidimensional model is significantly higher for more heterogeneous data with lower correlations for the underlying dimensions.
Keywords
  • Item Response Theory (IRT),
  • RASCH Models,
  • Validity/Reliability
Publication Date
April 30, 2013
Location
San Francisco, CA
Comments
Presented at the session: Use and Estimation of Subscores in the Multidimensional Context.
Citation Information
Steffen Brandt and Brent M Duckor. "Increasing Measurement Precision Using a Subdimensional Item Response Model Approach" American Educational Research Association (AERA) Annual Meeting (2013)
Available at: http://works.bepress.com/brent_duckor/43/