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Article
The Non-Destructive and Nano-Microstructural Characterization of Thermal-Barrier Coatings
JOM
  • Y. H. Sohn, University of Central Florida
  • B. Jayaraj, University of Central Florida
  • S. Laxman, University of Central Florida
  • B. Franke, University of Central Florida
  • J. W. Byeon, University of Central Florida
  • Anette M Karlsson, Cleveland State University
Document Type
Article
Publication Date
10-1-2004
Abstract

The durability of thermal barrier coatings (TBCs) plays an important role in the service reliability and maintainability of hot-section components in advanced turbine engines for aerospace and utility applications. Photostimulated luminescence spectroscopy (PSLS) and electrochemical impedance spectroscopy (EIS) are being concurrently developed as complimentary nondestructive evaluation (NDE) techniques for quality control and liferemain assessment of TBCs. This paper discusses recent achievements in understanding the residual stress, phase constituents, and electrochemical resistance (or capacitance) of TBC constituents—with an emphasis on the thermally grown oxide. Results from NDE by PSLS and EIS are correlated to the nano- and microstructural development of TBCs.

DOI
10.1007/s11837-004-0292-2
Version
Postprint
Citation Information
Sohn, Y. H., Jayaraj, B., Laxman, S., 2004, "The Non-Destructive and Nano-Microstructural Characterization of Thermal-Barrier Coatings," JOM, 56(10) pp. 53-56.