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Article
Stresses in Proton Exchange Membranes Due to Hygro-Thermal Loading
Journal of Fuel Cell Science and Technology
  • Yaliang Tang, University of Delaware
  • Michael H. Santare, University of Delaware
  • Anette M Karlsson, Cleveland State University
  • Simon Cleghorn, Gore Fuel Cell Technologies
  • William B. Johnson, Gore Fuel Cell Technologies
Document Type
Article
Publication Date
5-1-2006
Abstract

Durability of the proton exchange membrane (PEM) is a major technical barrier to the commercial viability of polymer electrolyte membrane fuel cells (PEMFC) for stationary and transportation applications. In order to reach Department of Energy objectives for automotive PEMFCs, an operating design lifetime of at least 5000 h over a broad temperature range is required. Reaching these lifetimes is an extremely difficult technical challenge. Though good progress has been made in recent years, there are still issues that need to be addressed to assure successful, economically viable, long-term operation of PEM fuel cells. Fuel cell lifetime is currently limited by gradual degradation of both the chemical and hygro-thermomechanical properties of the membranes.Eventually the system fails due to a critical reduction of the voltage or mechanical damage. However, the hygro-thermomechanical loading of the membranes and how this effects the lifetime of thefuel cell is not understood. The long-term objective of the research is to establish a fundamental understanding of the mechanical processes in degradation and how they influence the lifetime of PEMFCs based on perfluorosulfuric acid membrane. In this paper, we discuss the finite element models developed to investigate the in situ stresses in polymer membranes.

Comments

This research has been supported by grants from the U.S. Department of Energy, and W.L. Gore and Associates, Inc.

DOI
10.1115/1.2173666
Citation Information
Tang, Y., Santare, M. H., Karlsson, A. M., 2006, "Stresses in Proton Exchange Membranes due to Hygro-Thermal Loading," Journal of Fuel Cell Science and Technology, 3(2) pp. 119-124.