Article
Thermal effects on domain orientation of tetragonal piezoelectrics studied by in situ x-ray diffraction
Applied Physics Letters
(2006)
Abstract
Thermal effects on domain orientation in tetragonal lead zirconate titanate (PZT) and lead titanate (PT) have been investigated by using in situ x-ray diffraction with an area detector. In the case of a soft PZT, it is found that the texture parameter called multiples of a random distribution (MRD) initially increases with temperature up to approximately 100 °C and then falls to unity at temperatures approaching the Curie temperature, whereas the MRD of hard PZT and PT initially undergoes a smaller increase or no change. The relationship between the mechanical strain energy and domain wall mobility with temperature is discussed.
Keywords
- X-ray diffraction,
- lead compounds,
- texture,
- Curie temperature,
- electric domain walls,
- piezoceramics,
- ferroelasticity
Disciplines
Publication Date
2006
Publisher Statement
Copyright 2006 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.
The following article appeared in Applied Physics Letters 88 (2006): 242901 and may be found at http://link.aip.org/link/doi/10.1063/1.2213952.
Citation Information
Wonyoung Chang, Alexander H. King and Keith J. Bowman. "Thermal effects on domain orientation of tetragonal piezoelectrics studied by in situ x-ray diffraction" Applied Physics Letters Vol. 88 Iss. 24 (2006) Available at: http://works.bepress.com/alex_king/27/